Reliability, Yield, and Stress Burn-In:
A Unified Approach for Microelectronics Systems Manufacturing & Software Development

by Taeho Kim, Way Kuo, Wei-Ting Kary Chien

ISBN0792381076 / 9780792381075 / 0-7923-8107-6
PublisherKluwer Academic Pub
LanguageEnglish
EditionHardcover
List price$249.00
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