Proceedings of the 13th International Symposium on the Physical & Failure Analysis of Integrated Circuits:
IPFA 2006

by IEEE Electron Devices Society, IEEE Reliability/CPMT/ED Singapore Chapter, Chee Lip Gan

ISBN1424402050 / 9781424402052 / 1-4244-0205-0
PublisherIEEE
LanguageEnglish
EditionSoftcover
Buying Options

Found a mistake in this data?