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Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II:
2-4 August, 2005, San Diego, California, USA

by Society of Photo-Optical Instrumentation Engineers, Zu-Han Gu, Bhanwar Singh, Angela Duparre

ISBN 081945883X / 9780819458834 / 0-8194-5883-X
Publisher SPIE
Language English
Edition Softcover
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