BookFinder.com is a one-stop ecommerce search engine that searches over 150 million books for sale—new, used, rare, out-of-print, and textbooks.

Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components:
9-11 July 2002, Seattle, Washington, USA

by Society of Photo-Optical Instrumentation Engineers, Bhanwar Singh, Boeing Company, Angela Duparre

ISBN 0819445460 / 9780819445469 / 0-8194-4546-0
Publisher SPIE
Language English
Edition Hardcover
Find All Copies

 


› Find collectible copies of 'Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components: 9-11 July 2002, Seattle, Washington, USA'