ISBN is

978-0-470-84300-0 / 9780470843000

Optical Metrology

by

Publisher:Wiley

Edition:Hardcover

Language:English

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About the book:

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.

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