P.K. Footner (Footner, P.K.)

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  Evaluation of the Relative Stability of Scanning Electron Microscope Calibration Spheres in Vacuum, and During Irradiation with an Electron Beam
  by P.K. Footner, D.J. Laver
  Softcover, Office for Official Publications of the European Communities, ISBN 0119727560 (0-11-972756-0)
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  The Role of Microscopy in Semiconductor Failure Analysis
  by Richards, P.K. Footner
  Softcover, CRC Pr I Llc, ISBN 0198564325 (0-19-856432-5)