J.R. Michael (Michael, J.R.)

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  Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
  

  by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

  ISBN 9780306472923 (978-0-306-47292-3)
  Hardcover, Springer, 2003

  
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