Angela Duparre (Duparre, Angela)

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  Advanced Characterization Techiniques for Optics, Semiconductors, and Nanotechnologies: 3-5 August 2003 San Diego, California, USA
  by Bhanwar Singh, Angela Duparre
  Softcover, Society of Photo Optical, ISBN 0819450618 (0-8194-5061-8)
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  Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components: 9-11 July 2002, Seattle, Washington, USA
  by Society of Photo-Optical Instrumentation Engineers, Bhanwar Singh, Boeing Company, Angela Duparre
  Hardcover, SPIE, ISBN 0819445460 (0-8194-4546-0)
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  Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II: 2-4 August, 2005, San Diego, California, USA
  by Society of Photo-Optical Instrumentation Engineers, Zu-Han Gu, Bhanwar Singh, Angela Duparre
  Softcover, SPIE, ISBN 081945883X (0-8194-5883-X)
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  Optical Fabrication, Testing and Metrology II: 13-15 September 2005, Jena, Germany
  by Society of Photo-Optical Instrumentation Engineers, Roland Geyl, Lingli Wang, European Optical Society, Friedrich-Schiller-Universitat Jena, Deutsche Gesellschaft fur Angewandte Optik, Angela Duparre, SPIE Europe, Optonet (Organization)
  Softcover, SPIE, ISBN 0819459836 (0-8194-5983-6)
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  Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries: 30-31 July 2000, San Diego, USA
  by Society of Photo-Optical Instrumentation Engineers, Bhanwar Singh, Angela Duparre
  Hardcover, SPIE, ISBN 0819437441 (0-8194-3744-1)